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URLhttps://doi.org/10.18429/JACoW-IPAC2026-WEO5M05
TitleLow-emittance, Low-charge optimization of the Argonne Wakefield Accelerator for the Nanopatterned Microbunching Experiment
Authors
  • J. Phillips
    Particle Beam Physics Lab (PBPL)
  • R. Margraf-O'Neal, A. Ody, J. Power
    Argonne National Laboratory
  • A. Halavanau, N. Majernik
    SLAC National Accelerator Laboratory
  • B. Temizel Ozdemir, G. Ha
    Northern Illinois University, Argonne National Laboratory
  • D. Abell
    RadiaSoft (United States)
  • G. Andonian, J. Rosenzweig
    University of California, Los Angeles
  • H. Xu, N. Yampolsky
    Los Alamos National Laboratory
  • J. Maxson
    Cornell University
  • R. Ryne
    Lawrence Berkeley National Laboratory
AbstractLow-emittance microbunched electron beams are a key ingredient in free-electron lasers (FELs), facilitating gain and coherence in radiation production. It has been proposed, such as by the Compact X-ray FEL (CXFEL) group at Arizona State University, that nano-scale microbunching could be produced by rotating transverse beamlets into the longitudinal plane. Such a technique could make short-wavelength FELs much more compact, reducing cost. Thus, a collaboration has been formed to test this principle using the emittance exchange (EEX) beamline of the Argonne Wakefield Accelerator (AWA).* ** This experiment will take micro-scale transverse modulations on a TEM grid and produce mico-to-nano scale microbunches. Performing this with AWA’s 40 MeV electron beam will require low normalized emittance (~50 nm*rad), and low charge (~1pC) electron bunches that are not commonly produced at AWA. These proceedings will detail our work to produce and characterize this low emittance in the AWA beamline.
Paperdownload: WEO5M05.pdf
CiteBibTeX, LaTeX, Text/Word, RIS, EndNote
Conference17th International Particle Accelerator Conference
Series
LocationDeauville, France
Date17-22 May 2026
PublisherJACoW Publishing, Geneva, Switzerland
Editorial BoardEditorial Board
Online ISBN978-3-95450-252-3
Online ISSN2673-5350
Received13 May 2026
Revised19 May 2026
Accepted
Issued20 July 2026
DOI10.18429/JACoW-IPAC2026-WEO5M05
Pages2420-2424